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Representative CDMS-XY-1T Traceable Certificate (214KB PDF)
150: Pitch 169µm
The basic reference specimen is calibrated by the National Physical Laboratory (counter part of NIST)
All Lift-Out Grids have multiple indexed mounting positions for easy identification and positioning in the TEM
KPFM & EFM Sample Topcon Representative CDMS-XY-1T Traceable Certificate (214KBSample with Al and Au line arrays for KPFM and EFM tests DESCRIPTION Sample with Al and Au line arrays for KPFM and EFM tests Sample for KPFM and EFM tests featuring: arrays with alternating Al and Au lines deposited on an oxide covered silicon substrate line array pitches of 4, 8, 20 and 40 micrometers line height of approx. 35 nanometers chip mounted on a 15 millimeter glass disc metal disc stack thin silver plated copper wires connected to the Al
