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FIB4-200A 8 N/m Each cantilever comes individually characterized

SKU: 4725487664

4.3
EUR906.25 EUR946.25

Pay in 4 interest-free payments of $226.56 Learn more

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USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 2 - Aug 7

Description

Each cantilever comes individually characterized with both spring constant and tip radius accurately measured

and an entry hole for counter and reference electrodes are integrated into the glass fluid cell

Super Sharp Conductive Single Crystal Diamond Probes

*Note: Replaces previous part #MMMC

FIB4-200A 8 N/m Each cantilever comes individually characterized42N m, 320kHz, 10nm Tip Radius, 200nm Wide Spike @ 4m, Al Reflective Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS 42N m, 320kHz, 10nm Tip Radius, 200nm Wide Spike @ 4m, Al Reflective Coating High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 20: 1 at 4um from tip apex. Tip Geometry: High Aspect Ratio Tip Height: 10 15 Front Angle: 1. 2 0. 5 Back Angle: 1. 2 0. 5 Side Angle: 1. 2 0. 5 Tip

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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