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PELCO® Technical Notes: Evaluating an Analytical TEM with the NiOx Test Specimen (285kb pdf)
rapid adjustment from long to short working distances to change the deposition rate
and "C" and "D" cantilevers on the other side of the probe
Non-Magnetic
PR-UM-TnIR-D-10 Staining Pad PELCO® Technical Notes: Evaluating anDESCRIPTION PRODUCT SPECIFICATIONS Tapping mode probes for AFM IR Type D Unmounted A 10 pack of probes for tapping mode imaging and nanoIR spectroscopic measurements. Unmounted for use on Brukers IconIR system or others systems that can take a standard cantilever chip. This 300khz tapping mode probe has a full wrap gold coating, on the reflex side for increased feedback laser signal, on the tip side to enable nanoIR measurements. General
