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This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESPA-V2
PtIr Conductive Coating
-- Included in the new MM-SCM-V3 Scanning Capacitance Microscopy solution for MultiMode
the tobacco mosaic virus is undamaged by blunt tips but is compressed or disintegrated under sharper scanning styli
Test Grating for Tip Sharpness Hysitron This AFM probe is unmountedDESCRIPTION The TGTZ 400 test grating is intended for 3 D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control. Structure: Si wafer with grating in top surface Pattern type: Array of sharp tips Tip angle: About 50 degrees Tip Radius: 10nm Tip Height: 0. 3 0. 7m Period: 3 0. 01m Diagonal period: 2. 12m Chip size: 5 x 5 x 0. 5mm Effective area: Central square of 2 x 2mm
